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The Short Channel Effect Immunity of Silicon Nanowire SONOS Flash Memory Using TCAD Simulation

소개글 Author: Yang Seung-Dong, Oh Jae-Sub, Yun Ho-Jin, Jeong Kwang-Seok, Kim Yu-Mi, Lee Sang Youl, Lee Hi-Deok, Lee Ga-Won Organization: Yang Seung-Dong; Oh Jae-Sub; Yun Ho-Jin; Jeong Kwang-Seok; Kim Yu-Mi; Lee Sang Youl; Lee Hi-Deok; Lee Ga-Won Publish: Transactions on Electrical and Electronic Materials Volume 14, Issue3, p139~142, 25 June 2013
태그
  • SiNW
  • SONOS flash memory
  • DIBL
  • TCAD simulation