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Dry Etching Properties of HfAlO3 Thin Film with Addition O2 gas Using a High Density Plasma

소개글 Author: Woo Jong-Chang, Lee Yong-Bong, Kim Jeong-Ho Organization: Woo Jong-Chang; Lee Yong-Bong; Kim Jeong-Ho Publish: Transactions on Electrical and Electronic Materials Volume 15, Issue3, p164~169, 25 June 2014
태그
  • Etch
  • XPS
  • AES
  • HfAlO3
  • ICP