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Dependence of Electrons Loss Behavior on the Nitride Thickness and Temperature for Charge Trap Flash Memory Applications

소개글 Author: Tang Zhenjie, Dongwei Ma, Jing Zhang, Yunhong Jiang, Guixia Wang, Li Rong, Yin Jiang Organization: Tang Zhenjie; Dongwei Ma; Jing Zhang; Yunhong Jiang; Guixia Wang; Li Rong; Yin Jiang Publish: Transactions on Electrical and Electronic Materials Volume 15, Issue5, p245~248, 25 Oct 2014
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