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Dependence of Annealing Temperature on Properties of PZT Thin Film Deposited onto SGGG Substrate

소개글 Author: Im In-Ho, Chung Kwang-Hyun, Kim Duk-Hyun Organization: Im In-Ho; Chung Kwang-Hyun; Kim Duk-Hyun Publish: Transactions on Electrical and Electronic Materials Volume 15, Issue5, p253~256, 25 Oct 2014
태그
  • PZT
  • Thin film
  • Annealing temperature
  • Thickness
  • Hysteresis
  • William-Hall plot