Correlation between Physical Defects and Performance in AlGaN,GaN High Electron Mobility Transistor Devices
소개글Author: Park Seong-Yong, Lee Tae_Hun, Kim Moon-J.
Organization: Park Seong-Yong; Lee Tae_Hun; Kim Moon-J.
Publish: Transactions on Electrical and Electronic Materials Volume 11, Issue2, p49~53, 25 Apr 2010
