최근 본 자료

추천 연관자료

• A Study on Distributions of Boron Ions Implanted by Using B and BF2 Dual Implantations in Silicon
• Optimization of the Profiles in MeV Implanted Silicon Through the Modification of Electronic Stopping Power
• Correlation between Physical Defects and Performance in AlGaN,GaN High Electron Mobility Transistor Devices
• Dielectrophoretic Alignment and Pearl Chain Formation of Single-Walled Carbon Nanotubes in Deuterium
• ONO Ruptures Caused by ONO Implantation in a SONOS Non-Volatile Memory Device