Modeling and Prediction of Electromagnetic Immunity for Integrated Circuits
소개글Author: Pu Bo, Kim Taeho, Kim SungJun, Kim SoYoung, Nah Wansoo
Organization: Pu Bo; Kim Taeho; Kim SungJun; Kim SoYoung; Nah Wansoo
Publish: Journal of electromagnetic engineering and science Volume 13, Issue1, p54~61, 31 March 2013