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A Light-induced Threshold Voltage Instability Based on a Negative-U Center in a-IGZO TFTs with Different Oxygen Flow Rates

소개글 Author: Kim Jin-Seob, Kim Yu-Mi, Jeong Kwang-Seok, Yun Ho-Jin, Yang Seung-Dong, Kim Seong-Hyeon, An Jin-Un, Ko Young-Uk, Lee Ga-Won Publish: Transactions on Electrical and Electronic Materials Volume 15, Issue6, p315~319, 25 Dec 2014
태그
  • a-IGZO
  • Light stress mechanism
  • Oxygen vacancy
  • Negative-U center