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Charge Spreading Effect of Stored Charge on Retention Characteristics in SONOS NAND Flash Memory Devices

소개글 Author: Kim Seong-Hyeon, Yang Seung-Dong, Kim Jin-Seop, Jeong Jun-Kyo, Lee Hi-Deok, Lee Ga-Won Publish: Transactions on Electrical and Electronic Materials Volume 16, Issue4, p183~186, 25 Aug 2015
태그
  • NVM
  • SONOS
  • Retention
  • Charge migration