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Heavy-Ion Radiation Characteristics of DDR2 Synchronous Dynamic Random Access Memory Fabricated in 56 nm Technology

소개글 Author: Ryu Kwangsun, Park Mi-Young, Chae Jang-Soo, Lee In, Uchihori Yukio, Kitamura Hisashi, Takashima Takeshi Organization: Ryu Kwangsun; Park Mi-Young; Chae Jang-Soo; Lee In; Uchihori Yukio; Kitamura Hisashi; Takashima Takeshi Publish: Journal of Astronomy and Space Sciences Volume 29, Issue3, p315~320, 15 Sep 2012
태그
  • radiation effects
  • radiation hardening
  • synchronous dynamic random access memory

저작시기 2012-09월

등록일 2016-08-18

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